Harrington STEM Lecture: Pollen Analysis as a Tool for Forensic Analysis of Trace Evidence | Coykendall Science Building | Lectures & Talks | Hudson Valley; Chronogram
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Harrington STEM Lecture: Pollen Analysis as a Tool for Forensic Analysis of Trace Evidence 

When: Tue., Nov. 15, 4:30-6 p.m. 2016
Phone: (845) 257-3728
Email: nolent@newpaltz.edu
Price: Free
www.newpaltz.edu/sse/colloquium_series.html
Guest Speaker: Debra Willard, U.S. Geological Survey, Reston, VA. "Pollen Analysis as a Tool for Forensic Analysis of Trace Evidence."

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